摘要
实验采用不同厚度的低温取向硅钢热轧板冷轧至0.18 mm.通过XRD分析冷轧板表面和中心层的织构,通过EBSD分析了脱碳板截面的织构.结果表明,冷轧样品表层和中心层,随着压下率增大,{111}面织构总含量有所减少,{100}面织构总含量有所增多;脱碳样品中{111}面织构明显增多,尤其是{111}〈112〉织构组分,{100}面织构明显减少,尤其是{100}〈011〉织构组分,{411}〈148〉织构组分也明显增多;脱碳样品中,随着压下率增大,晶粒尺寸逐渐减小.不利于二次再结晶发展的织构随着压下率的增大明显增加,同时有利的CSL晶界随着压下率的增加会稍有减少.
In the experiment,different thickness of low temperature oriented silicon steel hot rolled plate was cold rolled to 0.18 mm.The texture of the surface and central layer of the cold rolled plate was analyzed by XRD,and the section of the decarburized plate was analyzed by EBSD.In the cold rolled samples,the results showed that the total content of{111}surface texture decreased,and{100}surface texture increased with the increase of reduction rate.In decarburized samples,the{111}texture increased significantly,especially the{111}〈112〉texture,and the{100}texture decreased significantly,especially the{100}〈011〉texture,and the{411}〈148〉texture increased significantly too.The grain size decreased with the increase of the reduction rate.The texture which was not conducive to the development of secondary recrystallization increased obviously,while the favorable CSL grain boundary decreased slightly with the increase of reduction rate.
作者
骆新根
黄咸波
郭小龙
杨佳欣
申明辉
LUO Xingen;HUANG Xinbo;GUO Xiaolong;YANG Jiaxin;SHEN Minghui(National Engineering Research Center for silicon steel,Wuhan 430080,China;School of Materials and Metallurgy,Wuhan University of Science and Technology,Wuhan 430081,China)
出处
《电工钢》
2019年第2期21-28,共8页
ELECTRICAL STEEL
关键词
薄规格取向硅钢
压下率
织构
冷轧
thin oriented silicon steel
reduction rate
texture
cold rolling