硅单晶应力自动检测系统

An Automatic System For Measuring Stresses in Silicon Single Crystals

介绍了一种利用微型计算机自动采集和处理数据的硅单晶应力检测系统。该系统由红外光源、偏振元件、样品架、红外摄像机、电视监视器、专用I/O 接口以及微型计算机组成。用自己设计的软件对光弹图形进行处理,得到样片中各点的应力分布。

This paper introduces an automatic system for measuring the stresses in Silicon single crystals,in which a microcomputer was adopted to collect and process data.The system was composed of infrared light source, polarizer and analyzer,sample rack,infrared camera,television monitor,special I/O adaptor and microcomputer.By means of the image-processing programmes we developed,the photoelastic patterns in some silicon single crystals have been processed and the stress distributions for some si...