基于边界扫描的簇测试系统设计

Design of Cluster Test System Based on Boundary Scan Technology

在对边界扫描及簇测试技术研究的基础上,以边界扫描测试总线控制器芯片为核心设计实现了一个簇测试系统,选择W-A的GNS算法对所设计的测试系统进行了簇测试实例验证。实验结果表明,该测试系统能够快速准确地检测出被测系统的固定逻辑故障和短路故障。

Based on the research of boundary scan and cluster test,a cluster test system is designed with test Bus controller chip,then it is verified with the GNS algorithm of W-A.According to the experiment result,the aptotic logic faults and short circuit faults of CUT(circuit under test) can be detected quickly with this test system.