On the Accuracy of Imaging on the Nanometer Scale:Geometry versus Material Properties in High Resolution AFM Studies

1 Results Intermittent Contact Mode Atomic Force Microscopy (ICM-AFM) imaging of sub-micron morphology is a routine operation in many fields of research from materials science to molecular biology,typically used to obtain three dimensional geometrical measures of surface structures.When it comes to the nanometer-angstrom range,however,quantitative interpretation of AFM morphology is less straightforward.Reports of non-topography-originated features as well as anomalies and conflicting reports in nanostr...