期刊文献+

触头分合过程中的短时熔焊现象

The Short-Time Welding Phenomena during the Contact Breaking/Making Operations
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摘要 通过对触头分合过程的电流/电压波形的分析,可以及时发现分断过程中出现的触点短时熔焊现象,有利于综合判断触头的工作可靠性和剩余寿命。且随操作次数的增加,短时熔焊现象的出现具有随机性和突发性,短时熔焊现象出现之前的分断燃弧时间基本保持不变。 Using the diagnosis technique of electrical contact life with the waveform of making and breaking current and voltage, it is easy to observe the short-time welding phenomena during the contact breaking operations. And this is available for the synthetical diagnosis on the reliability and the residual electrical life of the contact. The breaking current duration changes randomly with the increase of operation and the short-time welding may occur suddenly or randomly without previous cumulated increase of arc duration.
出处 《低压电器》 北大核心 2007年第23期13-15,共3页 Low Voltage Apparatus
基金 国家自然科学基金项目资助(50477044)
关键词 触头电寿命 波形分析法 短时熔焊 electrical contact endurance waveform characteristics method short-time welding
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参考文献7

  • 1狄美华,李震彪,吴细秀.开关电器触头电寿命诊断方法综述[J].高压电器,2004,40(3):201-204. 被引量:22
  • 2[2]KIYOTOMI M,SHUICHI N.A Proposal on Contact Surface Model of Electromagnetic Relays-Based on the Change in Showering Arc Waveforms with the Number of Contact Operations[J].IEICE Trans Electron,1998,81-C(3):399-407.
  • 3[3]HAMMERSCHMIDT M,NEUHAUS A R,RIEDER W F.The Effect of Material Transfer in Relays Diagnosed by Force and/or Voltage Measurement[J].IEEE Transactions on Components and Packaging Technologies,2004,27(1):12-18.
  • 4李震彪,张冠生.电触头接触电阻研究[J].电气开关,1992(3):12-20. 被引量:6
  • 5[5]SUGANUMA H,MUTOH A,NITTA S.Influence of Contact's Surface Conditions Change and Operating Conditions on Showering Noise Waveforms[C]//IEEE Instrumentation and Measurement Technology Conference.1994:36-39.
  • 6[6]NEUHAUS A R,RIEDER W F,HAMMERSCHMIDT M.Influence of Arc Duration and Current on Contact Welding in Low Power Switches[C]//Proceedings of the Forty-Eighth IEEE Holm Conference on Electrical Contacts.2002:17-20.
  • 7[7]DOUBLET L B,JEMAA N,HAUNER F,et al.Make Arc Erosion and Welding Tendency under 42 VDC in Automotive Area[C]//Proceedings of the Forty-Ninth IEEE Holm Conference on Electrical Contacts,2003:158-162.

二级参考文献17

  • 1杨冬莲.对电寿命试验方法的探讨[J].低压电器,1995(3):22-24. 被引量:13
  • 2翟国富,赵新民,许峰,刘茂恺.电器可靠性寿命试验新方法的探讨[J].低压电器,1996(6):28-30. 被引量:6
  • 3Cai Zhiyuan, Ma Shaohua, Li Wei, et al. Monitor of Electrical Endurance of Vacuum Circuit Breaker's Contacts [A].XXth International Symposium on Discharges and Electrical Insulation in Vacuum [C], Tours, France, IEEE, 2002.
  • 4Ma Shaohua, Xu Jianyuan, Wang Jimei. A Method for Intellectualized Detection and Fault Diagnosis of Vacuum Circuit Breakers[A]. IEEE 19th Int. Symp. on Discharges and Electrical Insulation in Vacuum [C], Xi'an, China, IEEE, 2000.
  • 5Paul N Stoving, John F Baranowski. Interruption Life of Vacuum Circuit Breakers [A]. IEEE 19th Int. Symp. on Discharges and Electrical Insulation in Vacuum [C], Xi'an,China, IEEE, 2000.
  • 6Kang Pengju, David Birtwhistle, Kame Khouzam. Transient Signal Analysis and Classification Monitoring of Power Switching Equipment Using Wavelet Transform and Artificial Neural Networks[A]. 1998 Second International Conference on Knowledge-based Intellige
  • 7I Manea, C Chiciu, F Balasiu, et al. Complex Method to Diagnose the Technical State of the Medium and High Voltage Circuit Breaker after Short-circuit Events [A]. 16th International Conference and Exhibition on Electricity Distribution [C], Amsterdam, Net
  • 8Miyajima Kiyotomi, Nitta Shuichi. A Proposal on Contact Surface Model of Electromagnetic Relays--Based on the Change in Showering Arc Waveforms with the Number of Contact Operations [J]. IEICE Trans. Electron, 1998, E81-C (3): 399-407.
  • 9M Kezunovic, C Nail, Z Ren, et al. Automated Circuit Breaker Monitoring and Analysis [A]. IEEE Power Engineering Society Summer Meeting [C], Chicago, USA, IEEE, 2002.
  • 10D Birtwhistle, I D Gray. A New Technique for Condition Monitoring of MV Metalclad Switchgear[A]. Fifth International Conference on Trends in Distribution Switchgear: 400 V~145 kV for Utilities and Private Networks [C], London, UK, IEE,1998.

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