摘要
用激光分子束外延方法在SrTiO3(100)基底上外延生长了BaNbxTi1-xO3(0.01≤x≤0.03)导电薄膜.原子力显微镜测得BaNb0.3Ti0.7O3薄膜表面均方根粗糙度在2μm×2μm范围内为2.4(?),达到原子尺度光滑.霍尔测量表明BaNbxTi1-xO3薄膜为n型导电薄膜;在室温下,BaNb0.02Ti0.98O3、BaNb0.2Ti0.8O3和BaNb0.3Ti0.7O3薄膜的电阻率分别为2.43×10-4Ω·cm、1.98×10-4Ω·cm和1.297×10-4Ω·cm,载流子浓度分别为5.9×1021cm-1、6.37×1021cm-1和9.9×102lcm-1.
The epitaxial BaNbx.Ti1-x O3(0.01≤x≤0. 3)conductive thin films on SrTiO3(100) substrates were grown by laser molecular beam epitaxy. The root-mean-square surface roughness of the deposited thin films is 2. 4 A within 2μm × 2μm area surface measured by atomic force microscopy, which means that the films are atomically smooth. The films are n-type conductive thin films confirmed by Hall measurements. The resistivity of BaNb0.02Ti0.98O3,BaNb0.2Ti0.8O3 and BaNb0.3Ti0.7O3 is 2.43×10-4Ω·cm,1.98×10-4Ω·cm and 1. 297 × 10-4Ω·cm, respectively, and the carrier concentration is 5.9×1021cm-1,6.37×1021cm-1and 9. 9×1021cm-1 , respectively, at the room temperature.
出处
《红外与毫米波学报》
SCIE
EI
CAS
CSCD
北大核心
2002年第z1期61-63,共3页
Journal of Infrared and Millimeter Waves