Study on Lattice Parameter Variance and Eutectic Reaction during Crystal Growth of Nd,Cr∶GSGG by Czochralksi Method

During the crystal growth of Nd,Cr∶GSGG by Czochralski method,in some cases eutectic reaction occurred in the nether region of the crystal,and the boule was divided into two obvious different parts,which is upper Nd,Cr∶GSGG crystal and the nether coexisting Nd,Cr∶GSGG and GdScO_(3).By X-ray powder diffraction,the structure change of NdCr∶GSGG crystal ofΦ27 mm×120 mm with eutectic along its grown direction<111>was studied.By the least square method and extrapolation function f=sinθ-sinθ^(1-t)(t is an adjustable parameter),the lattice parameters of Nd,Cr∶GSGG and additional GdScO_(3)phase were computed.The results indicate that the lattice parameters of Nd,Cr∶GSGG increase along its growth direction,which changes from a=(1.25650±0.00007)nm of the top to(1.25798±0.00010)nm of the bottom.In the process of Nd,Cr∶GSGG growth,Gd^(3+)in Nd,Cr∶GSGG is partly replaced by Nd^(3+)with larger ionic radii,and the volatilization of Ga component results in its composition variance,which cause the lattice parameters increase along growth direction.In the eutectic section,there are the Nd,Cr∶GSGG and the second phase orthorhombic GdScO_(3).The lattice parameters of GdScO_(3)are a=0.5443±0.0007,b=0.5699±0.0005 and c=(0.7865±0.0009)nm,and that of Nd,Cr∶GSGG is(1.25798±0.00010)nm.In the final growth stage,excessive volatilization of Ga composition during the crystal growth causes the growth melt deflect of the Nd,Cr∶GSGG solid solution range seriously,and results in the eutectic reaction,and the outgrowth of Nd,Cr∶GSGG and GdScO_(3).So it is necessary to decrease the effect of gallium volatilization during the growth in order to avoid eutectic growth and obtain a high-quality Nd,Cr∶GSGG.