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Growth Defects in Langasite Crystals Observed with White Beam Synchrotron Radiation Topography

Growth Defects in Langasite Crystals Observed with White Beam Synchrotron Radiation Topography
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摘要 Langasite single crystal was grown by the Czochralski method and its perfection was assessed by white beam synchrotron radiation topography. It is found that the growth core and the growth striations are the primary growth defects and they show strong X-ray kinematical contrast in the topographs. Another typical defect in LGS crystal is dislocation. The formation mechanisms of these growth defects in LGS crystals were discussed.
出处 《Journal of Rare Earths》 SCIE EI CAS CSCD 2006年第z1期159-161,共3页 稀土学报(英文版)
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参考文献4

  • 1[1]Il Hyoung,Keun Ho Auh.Crystal growth and piezoelectric properties of langasite (La3Ga5SiO14) crystals[J].Materials Letters,1999,41:241.
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