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Preparation and characteristics of indium tin oxide (ITO) thin films at low temperature by r.f. magnetron sputtering 被引量:4

Preparation and characteristics of indium tin oxide (ITO) thin films at low temperature by r.f. magnetron sputtering
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摘要 Low resistivity and highly transparent ITO conducting films for solar cell applications were fabricated at low temperature by r.f. magnetron sputtering. ITO films were deposited on glass and silicon substrate. Electrical, optical, structural and morphological properties of the ITO films were investigated in terms of the preparation conditions. The annealing treatment has improved the properties of the ITO films at different degree. The maximum transmittance of the obtained ITO films in the visible range is over 92%, and the low resistivity for the ITO films are about 3.85×10-4 Ω·cm at 80 ℃, 80 W after annealing. Low resistivity and highly transparent ITO conducting films for solar cell applications were fabricated at low temperature by r.f. magnetron sputtering. ITO films were deposited on glass and silicon substrate. Electrical, optical, structural and morphological properties of the ITO films were investigated in terms of the preparation conditions. The annealing treatment has improved the properties of the ITO films at different degree. The maximum transmittance of the obtained ITO films in the visible range is over 92%, and the low resistivity for the ITO films are about 3.85×10-4 Ω·cm at 80 ℃, 80 W after annealing.
出处 《Rare Metals》 SCIE EI CAS CSCD 2006年第z1期137-140,共4页 稀有金属(英文版)
基金 This project was financially supported by the Natural Science Foundation of Hebei Province, China. (No. F2005000073).
关键词 ITO r.f. MAGNETRON SPUTTERING low temperature ANNEALING ITO r.f. magnetron sputtering low temperature annealing
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