基于单光源投影的细丝动态测量方法

Dynamic measuring method of filament by single-pointed source projection

细丝尺寸的波动影响到相关产品的质量。目前细丝尺寸的测量有光电能量法、激光束扫描法、激光衍射法、投影成像法等;对于线径0．1～1．0mm细丝线,我们采用半导体激光作单光源、菲涅尔双棱镜(Fresnel)产生双光源投影照射细丝线、CCD信号检测的方法,获得细丝动态测量关系式;通过对动态投影尺寸的测量,获得较好的检测精度,解决了细丝生产工序的复杂性、波动性导致的动态质量监控问题。

The undulation of filament diameter impacts the quality of correlative products. The filament diameter usually be measured by means of photoelectricity energy, laser scanning, laser diffraction and projection imaging. A bi-lamp-house projection method was proposed by zhao Bin etc. , which measures 0. 1～1. 0mm diameter filament by using birefringent-crystal. A new method is proposed in this paper. It makes a semiconductor laser lamp-house into two bunches of light by Fresnel biprism. The two bunches of light are projected onto filament and then detected by CCD. Thus, the connection expression are obtained. The accuracy of this method is much higher due to the magnified projection. The complex and undulate problems of dynamic quality monitoring are solved.