面向生命周期的复杂电子装备测试性建模

Testability modeling of complicated electronic equipments facing to life cycle

综合国内外现有的测试性标准和模型,提出了一种面向复杂电子装备生命周期的层次化测试性建模方法。该方法体现了”并行工程”思想,从生命周期角度考虑测试性设计,支持复杂电子装备的健康管理。给出的测试性设计框架不但充分利用了现有的商用成熟技术,而且构建了自身的与可靠性、与可维护性相关联的复用数据库,被证明可以大大提高复杂电子装备测试性设计的一次成功率,缩短研制的时间,改善设计质量。

Synthesizing present testability standards and models, a hierarchical testability modeling facing to life cycle of complicated electronic equipments is given out in the paper. The model embodies the thought of 'concurrent engineering'. The modeling method considers DFT from aspect of life cycle and supports complicated electronic equipments' health management. The given DFT frame included in the model not only can make full use of existing COTS, but also holds its own reuse database which is well related to reliability engineering and maintenance engineering. A typical example is given in the end, which proves that the model can greatly enhance DFT first pass rate, shorten developing time and improve design quality of electronic equipments.