关于挂镀线行车相撞在程序上的改进

The Improvement on Program for the Collision of Travel Cranes on Automatic-rack Line

上海新阳电子化学有限公司所生产的挂镀线用于TO220集成芯片的电镀。在该生产线试运行期间,时而出现行车相撞的情况,通过对程序的分析,行车相撞的产生是在行车行走过程中,由于传感器受到外部干扰,使得内部计数器在经过的槽位没有进行计数,这样就会造成行车多行走一个或几个槽位,行车相撞也就在所难免。在此在程序上加以改进以解决由于上述原因造成的行车相撞。

The automatic-rack line manufactured by Shanghai Xinyang Electronics Chemicals Co., Ltd. is used to plate TO220 integrated chip. During the operation of this assembly-line, collision of two traveling cranes happens occasionally. By the analysis on original program, the collision is caused by the outside interruption on sensors, which makes the inside counter not count when traveling crane passes a slot, in turn, the traveling crane inevitably will walk greater than one slot. Through the improvement on the original program the collision of traveling cranes is effectively sovled.