纳米粒子粒径的测量与表征的研究

Study on measurement and characterization of nanoparticle diameters

采用X射线衍射法(谢乐法)与透射电子显微镜法(TEM法)对纳米粒子粒径进行测量与表征.研究结果表明,该两种方法都可用于纳米粒子粒径的的测量与表征,而且测量结果较吻合.纳米粒子实际平均粒径可能大于用X射线衍射线线宽法测定结果,而小于用透射电镜法测定结果.对它们的优缺点进行了对比分析.

X-ray diffraction method (Scherre method) and transmition electron microscopy were used in the measurement and characterization of nanoparticles diameters. The research results show that, those two methods were all available for above purpose, and the results measured by the two methods were identical; the real mean diameters of nanoparticles may be larger than the mean diameters measured by X-ray diffraction method, and smaller than the mean diameters measured by TEM. The advantages and disadvantages of th...