摘要
采用改进的溶胶-凝胶(sol-gel)工艺制备了掺Bi(Ba0.65Sr0.35)Ti O3(简称BSTBi)薄膜.XRD研究结果表明,BST系列薄膜具有单一钙钛矿结构;AFM测试结果表明BST薄膜表面平整致密,无裂纹.表面均方根粗糙度约为3~6.5nm,晶粒大小分布均匀,直径约为50~75nm.随着热处理温度的提高,BST薄膜的晶粒变大,表面粗糙度变大.
(Ba_ 0.65 ,Sr_ 0.35 )TiO_3(BST) and Mg doped BST thin films were prepared by an improved sol-gel method. XRD analyses showed that all the BST films had formed pure cubic perovskite structure; AFM graphs showed that BST films were smooth, dense and crack-free. The Root Mean Square(RMS) of these films were about 3~6.5nm and the average grain sizes were about 50~75nm. The RMS and grain size of BST films become larger with higher annealing temperature.
出处
《四川大学学报(自然科学版)》
CAS
CSCD
北大核心
2005年第S1期400-402,共3页
Journal of Sichuan University(Natural Science Edition)
基金
国家自然科学基金(60471044)