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Metallographic sample prepared by ion beam etching 被引量:3

Metallographic sample prepared by ion beam etching
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摘要 Ion beam etching technique was used to reveal the metallograhpic microstructure and interface morphology of electroplating chromium coating, in particular, whose substrate surface layer was treated in advance by laser quenching. Chemical etchings were also conducted for comparison. The reveal microstructures were observed and analyzed by scanning electron microscopy. The results show that ion beam etching can reveal well the whole microstructures of composite coating-substrate materials.
出处 《中国有色金属学会会刊:英文版》 CSCD 2004年第z1期282-285,共4页 Transactions of Nonferrous Metals Society of China
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