摘要
电路的测试与诊断已有了广泛的研究,但被测电路的最小测试集的寻找一直是个难题。本文引用图论中的有关概念,对使用离散事件系统理论进行建模的电路进行最小测试集的查找,能够方便快捷的获得被测电路的最小测试集。最后用实例对该方法进行了验证。
Test and diagnosis of the circuit under test (CUT) have been studied widely. But looking for the mini-
mal test set of CUT is still a difficult question. This paper excerpts some idea from graph theory to look for the
minimal test set of CUT,which was modeled using DES. This method can be used to gain the minimal test set of
the circuit under test easily and quickly. In the end,some examples were given to validate this method.
出处
《仪器仪表学报》
EI
CAS
CSCD
北大核心
2003年第z2期295-297,共3页
Chinese Journal of Scientific Instrument
基金
2001年安徽省科研重点项目(No.01041177)
关键词
图
论
离散事件系统
可测性
最小测试集
Graph theory
Discrete event system
Testability
Minimal test set
