The Photoelectron Behaviors of Sulfur Sensitizing AgCl in the Optical Storage Process

The Photoelectron Behaviors of Sulfur Sensitizing AgCl in the Optical Storage Process

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摘要 Using Microwave Dielectric Spectrum Detection Technology (MDSD) detects the instantaneous decay processes of free electrons and shallow trapped electrons of cubic AgCl at the same time. The best condition of our experiment is 55癈. Using Microwave Dielectric Spectrum Detection Technology (MDSD) detects the instantaneous decay processes of free electrons and shallow trapped electrons of cubic AgCl at the same time. The best condition of our experiment is 55癈.

作者 Shaopeng Yang, Xiaodong Lu, Xiaowei Li, Li Han, Guangsheng Fu Physical science and technology of Hebei University Baoding P.R.China, Tel: 086-312-5079355, fax: 086-312-5011174

出处《光学学报》 EI CAS CSCD 北大核心 2003年第S1期865-866,共2页 Acta Optica Sinica

关键词 AGCL of in

分类号 O438 [机械工程—光学工程]

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The Photoelectron Behaviors of Sulfur Sensitizing AgCl in the Optical Storage Process

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