模拟电路可测性问题分析

Analog circuits can be measured analysis of the problem

为解决含大量不可测节点电路的测试问题及大规模电路测试成本过高的问题,本文分析了电路的可测拓扑结构和可测拓扑条件,提出了模拟电路可测性问题分析。

To address a large number of nodes unpredictable circuit test problem and large-scale circuit test the problem of excessively high costs, the paper of the circuit can be measured topology and topology conditions can be measured, by the analog circuit can be measured analysis of the problem.