模拟集成电路模块生成系统的电气性能研究

Electrical Property Analysis of the Module Generator Environment for Analog Integrated Circuits

文章对模拟集成电路模块生成系统的电气性能进行了系统研究 ,如 MOS晶体管失配量、栅极 RC常数、寄生电容及路径载流等。并将各电气参数的估算值与具体应用相结合 ,控制不同限制条件及应用背景下的模块生成 ,增强电路设计的可靠性。采用该电气性能驱动的模块生成系统 ,已经辅助设计出多个高性能集成运算放大器、模拟开关等芯片版图。

This paper analyzes the related electrical properties of the module generator environment for analog integrated circuits, such as transistor mismatching, RC time constant of MOS transistor gates, parasitic capacitance and electromigration The estimation of electrical properties was taken into consideration during the module generation in order to satisfy the different constraints and application requirements It enhances the reliability of circuit design A number of high quality operational amplifiers and analog switches have been designed with the help of this electrical property driven module generator environment