具有最小搜索空间的优化测试生成算法

The Optimum Test Generation Algorithm with Minimal Search Space

介绍了一种优化的测试生成算法。该算法基于遗传算法 ,使用故障信号传播路径上的信号线来构造算法的评价函数 ,使得算法具有最小的搜索空间。该方法不同于传统的方法 ,它不需要故障传播、回退等过程。

This paper mainly proposes an optimum test generation algorithm based on the genetic algorithm.An effective evaluation function is constructed,which use the signal line on the propagation path among the fault point and primary outputs.That makes the algorithm has the minimal search space.This method is radically different from the conventional methods,and it doesn't need the processes of propagation and backtracks.Some experimental results on the combinational circuits demonstrate the feasibility of this algorithm.