摘要
应用量子力学中的电子遂道效应而制作的、能直接观察物质表面微观性状和原子配列的现代化超高分辨率装置——扫描遂道显微镜,简称‘STM’,已开发整整十年。本文就其原理,特性,技术关键,发展现状,应用领域以及目前存在的问题作了综合评述。最后指出其发展趋势。
It's whole ten years since modern superhigh resolution instrument—Scanning Tunneling Microscope has been developed, which can directly observe the microconstructure on the surface of an object and amomic arrangement using electric tunneling effect in applied Quntum—Mechanics. In this article, the principle、characteristic、key techinic、the condition of today、applied region and present problem are synthetically discussed. At last, we have pointed the divelopment tendency of scanning tunneling microscope.
出处
《长春光学精密机械学院学报》
1993年第2期6-11,共6页
Journal of Changchun Institute of Optics and Fine Mechanics
关键词
扫描隧道显微镜
显微镜
制造
发展
Scanning Tunneling Microscope
resolution
constant current mode
automic force microscope
scanning probe microscope