光栅投影三维测量的原理及关键技术分析

Principles of 3-D Profilometry Measurement using Grating Projection and Key Technique Analysis

针对光栅投影三维测量技术的原理进行了综述 ,并就国内外的发展和应用状况 ,对测量中的关键技术 ,如相位测量、解相位、面形连续性、数据配准和拼接等进行了分析 。

The principles of 3 D profilometry measurement using grating projection are reviewed.On the basis of current development and application status,some key techniques,such as phase demodulation,phase unwrapping,physical discontinuities,data registration and connection,are discussed,which prove the method's advantages.