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Evaluating and Forecasting System for Test Generation Algorithms

Evaluating and Forecasting System for Test Generation Algorithms
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作者 KANG Jian-guo
出处 《Journal of Shanghai University(English Edition)》 CAS 2001年第z1期37-41,共5页 上海大学学报(英文版)
基金 Supported by The National Science Foundation of China (NSFC)Grant No. 69873030
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参考文献8

  • 1[1]Michalewicz Z., Genetic Algorithms + Data Structures =Evolution Programs, Berlin: Springer-verlag, 1994
  • 2[2]David G. Kleinbaum, and Lawrence L. Kupper, Applied Regression Analysis and other Multivariable Methods, PWS Pub., Duxbury Press, 1978:131-144
  • 3[3]John A. Waicukauski, Paul A. Shupe, David Giramma, Arshad Matin, ATPG for ultra-large structured designs, Proceedings of 1990 International Test Conference, 1990:44-51
  • 4[4]Abhijit Gosh, Srinivas Devadas, A. Richard Newton, Test generation and verification for highly sequential circuits, IEEE Transaction on Computer-Aided Design, 1991,10(5): 652-667
  • 5[5]Garvin Percy Dias, Forecasting Methodology for Sequential Circuit Test Generation, 1994
  • 6[6]Tukwasibwe Justaf Frank, Forecasting Testability Parameters for Combinational Logic Circuits Using Genetic Algorithms,1998
  • 7[7]Cen Wei, Forecasting Testability Parameters for Logic Circuits Using Genetic Algorithm, 2000 (in Chinese)
  • 8[8]Hang Jing, Extracting Characteristic Parameters for Combinational and Sequential Circuits, 2001 (in Chinese)

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