全差示光度法联测锗富集物中锗硅

Determination of Germanium and Sili con by Full -Differential Photometr y

试验在同一份处理好的试样中,采用低温蒸干排除锗的干扰,比色测定硅;采用全差示光度法测定锗,该方法适应于锗富集物中硅0.5%～10.0%、锗1.0%～40%含量范围的测定。

In the article,a new method of determinating germanium and silicon in th e same germinum enriched sample was introduced.It could be adapted t o determine germanium and silicon in the same sample in which germanium is1.0%～40%and silicon is 0.5%～10.0%.