期刊文献+

一种基于三模冗余令牌的自恢复控制器

Self-recovering controller based on TMR-token
下载PDF
导出
摘要 针对集成电路特征尺寸进入纳米级后软错误率持续攀升的问题,本文以状态机拆分和三模冗余令牌为基础,提出更为可靠的自恢复控制器结构,并对典型基准电路进行了故障注入和仿真综合实验。结果表明,该结构以很小的硬件代价取得了更好的容错效果。 As the feature sizes decrease to nm,the ever increasing soft error rate continues its stronger and stronger challenge to ICs such as controllers face.A more dependable self-recovering controller structure was presented based on finite state machine splitting and token hardened.The experimental results of fault injection,simulation and synthesis on some typical benchmarks show that the presented structure achieves a perfect soft error tolerant effect at a very low cost of hardware.
出处 《计算机应用》 CSCD 北大核心 2009年第2期614-617,共4页 journal of Computer Applications
基金 国家自然科学基金资助项目(60876028) 国家自然科学基金重点项目(60633060) 国家863计划项目(2007AA01Z113) 中国博士后科学基金资助项目(20080430050) 高校博士点新教师基金资助项目(2008JYXJ0829) 中国科学院计算机系统结构重点实验室开放课题(ICT-ARCH200704)
关键词 自恢复 卷回 状态机拆分 三模冗余 令牌 self-recovering rollback Finite State Machine(FSM) splitting Three Modular Redundancy(TMR) token
  • 相关文献

参考文献2

二级参考文献53

  • 1Ravishankar K Iyer,David J Rossetti.A measurement-based model for workload dependence of CPU errors[J].IEEE Trans on Computer,1986,35(6):511-519
  • 2D P Siewiorek,R S Swarz.Reliable computer systems:Design and evaluation[M].2nd Edition.Bedford Mass:Digital Press,1992
  • 3S Chau.Fault injection boundary scan design for verification of fault tolerant systems[C].IEEE Int'l Test Conference,Washington,1994
  • 4J Gaisler.Evaluation of a 32-bit microprocessor with built-in concurrent error-detection[C].FTCS-27,Seatle,Washington,USA,1997
  • 5G Miremadi,J Torin.Evaluating processor-behavior and three error-detection mechanisms using physical fault-injection[J].IEEE Trans on Reliability,1995,44(3):441-454
  • 6W A Moreno,et al.First test results of system level fault tolerant design validation through laser fault injection[C].ICCD'97:VLSI in Computers and Processors,Austin,Texas,USA,1997
  • 7G A Kanawati,N A Kanawati,J A Abraham.FERRARI:A flexible software-based fault and error injection system[J].IEEE Trans on Computers,1995,44(2):248-260
  • 8J Carreira,H Madeira,J G Silva.Xception:A technique for the experimental evaluation of dependability in modern computers[J].IEEE Trans on Software Engineering,1998,24(2):125-136
  • 9V Sieh,O Tschache,F Balbach.VERIFY:Evaluation of reliability using VHDL-models with embedded fault descriptions[C].FTCS-27,Seatle,Washington,USA,1997
  • 10E Jenn,J Arlat,et al.Fault injection into VHDL models:The MEFISTO tool[C].FTCS-24,Austin,Texas,USA,1994

共引文献38

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部