摘要
针对集成电路特征尺寸进入纳米级后软错误率持续攀升的问题,本文以状态机拆分和三模冗余令牌为基础,提出更为可靠的自恢复控制器结构,并对典型基准电路进行了故障注入和仿真综合实验。结果表明,该结构以很小的硬件代价取得了更好的容错效果。
As the feature sizes decrease to nm,the ever increasing soft error rate continues its stronger and stronger challenge to ICs such as controllers face.A more dependable self-recovering controller structure was presented based on finite state machine splitting and token hardened.The experimental results of fault injection,simulation and synthesis on some typical benchmarks show that the presented structure achieves a perfect soft error tolerant effect at a very low cost of hardware.
出处
《计算机应用》
CSCD
北大核心
2009年第2期614-617,共4页
journal of Computer Applications
基金
国家自然科学基金资助项目(60876028)
国家自然科学基金重点项目(60633060)
国家863计划项目(2007AA01Z113)
中国博士后科学基金资助项目(20080430050)
高校博士点新教师基金资助项目(2008JYXJ0829)
中国科学院计算机系统结构重点实验室开放课题(ICT-ARCH200704)
关键词
自恢复
卷回
状态机拆分
三模冗余
令牌
self-recovering
rollback
Finite State Machine(FSM) splitting
Three Modular Redundancy(TMR)
token