CMOS存储器中地址译码器的开路故障及测试

Open Defects and Testing in CMOS RAM Address Decoders

对 CMOS存储器中地址译码器的开路故障进行了分析和分类 ,得出了其中有一类开路故障不能用常用的测试算法可靠的测试出 。

At first,this paper analyces the open defect of CMOS RAM address decoder,it comes out that one type open defect cannot be detected by march test algorithm,and then we give the test method of this type undetectable fault and the design scheme with built-in tolerance against hard-to-detect open defects.