5[5]Pieruschka E. Relation Between Lifetime Distribution and the Stress Level Causing Failure[S]. LMSD-400800, Lockheed Missile and Space Division, Sunnyvale, California, 1961
6[6]Tyoskin O I, Krivolapov S Y. Nonparametric Model for Step-Stress Accelerated Life Testing[J]. IEEE Trans on Reliability, Vol. 45-2, 1996,(6)
7[7]Nelson W B, Accelerated Life Testing-Step-Stress Models and Data Analysis[J]. IEEE Trans on Reliability, Vol. R-29,1980