基于单片机的半导体激光器应用控制技术

Application and control technique of semiconductor laser diode based on single-chip microcomputer

针对半导体激光器(LD)应用领域十分广泛的特点,提出了一种新型 LD 功率(P)-电流(I)-电压(V)的自动测试方法。该方案采用华邦51系列单片机(SCM)W78E58BP 作为控制核心,实现了高稳定度的 LD连续及脉冲驱动、恒流控制及功率、电压采集。LD 控制单元中,应用负反馈技术实现注入电流 I_f、驱动电压 V_f和光功率 P_O 的高稳定控制,电流控制精度为±0.1%;单片机控制电信号的放大、保持和采集,模拟、数字相结合,提高了信号处理的精度。最后,给出了通过 RS-232接口对 LD 进行 PIV 测试的曲线及相关参数的测试结果,并给出了误差分析。该测试方法已得到广泛应用。

A new power (P)-current (I)-voltage (V) automatic testing technique of semiconductor laser diode controlled by single-chip microcomputer (SCM) considering LD much wide application was presented.In this paper, SCM was introduced as system control center,which realized reliable constant current and pulse current driver for laser diode,optical power collection and voltage collection.In laser diode driver control module,negative feedback technique was used to control drive current (I_f),output optical power (P_o) and forward voltage (V_f) respectively with high stability,the accuracy of constant current is±0.1%.Furthermore,magnification,maintenance and collection of electronic signal were executed by both digital circuit and stimulant circuit controlled by SCM,which made signal processing much higher precise.In the end,PIV testing curves and related parameters of laser diodes were presented based on the testing method,and the error of testing result was analyzed.The PIV testing method's application range is extended.