摘要
利用面阵CCD测量不规则平面物体面积时 ,图像畸变对测量精度影响很大。按照常规方法对图像进行校正后再测量面积 ,则速度太慢。针对面积测量 ,介绍了两种快速校正方法 ,并进行了比较。通过实验 ,证明该方法具有校正速度快。
In the area measurement of an object with irregular plane using area array CCD, the precision is greatly influenced by image distortion. The speed may be very slow if the measurement is performed after distortion correction as usual. Two methods for high speed correction are presented for area measurement and the difference between them is discussed. By experiment, it is proved that using these methods, the measurement could be done quickly and accurately.
出处
《半导体光电》
CAS
CSCD
北大核心
2002年第1期44-47,共4页
Semiconductor Optoelectronics
关键词
图像畸变
快速校正
面积测量
面阵CCD
image distortion
high speed correction
area measurement
area array CCD