摘要
用物理汽相沉积法在水平系统中生长有机半导体并五苯晶体薄膜。用 10~ 30毫克的源生长出 2 0~ 30mm2 大小的适合特性测量和器件制备的晶体薄膜。利用扫描电镜 (SEM )、透射电镜 (TEM )和X射线衍射仪 (XRD)
Physical vapor deposition in horizontal systems has been used to grow crystal thin film of organic semiconductor pentacene. Using 10~30 mg of starting material, 20~30 mm 2 sized crystal thinfilms, suitable for characterization measurements or device fabrication, have been grown. The thin film of pentacene crystal is analyzed by using TEM, X ray diffraction and scanning electron microscopy.
出处
《半导体光电》
CAS
CSCD
北大核心
2002年第6期418-420,共3页
Semiconductor Optoelectronics
基金
国家自然科学基金资助项目 (6 0 176 0 2 2 )
关键词
物理汽相沉积
晶体薄膜
并五苯
physical vapor deposition
crystal thin film
pentacene