期刊文献+

辐照对SiGe HBT增益的影响

Irradiation Effects on DC Current Gain of SiGe HBT
下载PDF
导出
摘要 比较了电子和γ射线辐照后SiGe HBT和Si BJT直流增益β的变化.在Vbe≤0.5V时,较高剂量辐照时SiGe HBT的放大倍数辐照损伤因子d(β)为负;在Vbe≥0.5V时,SiGe HBT的d(β)远比Si BJT的小.SiGe HBT有更好的抗辐照性能.针对测得的一些电子陷阱对辐照致性能变化的影响进行了讨论.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2007年第z1期430-434,共5页 半导体学报(英文版)
基金 国家自然科学基金资助项目(批准号:10075029,10375034)
  • 相关文献

参考文献8

  • 1[2]Ohyama H,Vanhellemont J,Takami Y,et al.Proton irradiation effects on the performance of Si1-xGex devices.Phys Status Solidi A,1996,158(1):325
  • 2[3]Roldan J M,Ansley W E,Cressler J D,et al.Neutron radiation tolerance of advanced UHV/CVD SiGe HBT BiCMOS technology.IEEE Trans Nucl Sci,1997,44(6):1965
  • 3[4]Lin H,Lee S.Super-gain AlGaAs/GaAs heterojunction bipolar transistors using an emitter-thinning design.Appl Phys Lett,1985,47:839
  • 4[5]Meng X T,Yang H W,Kang A G,et al.Effects of neutron irradiation on SiGe HBT and Si BJT devices.Mater Sci:Mater in Electron,2003,14(4):199
  • 5[6]Lin H,Lee S.Super-gain AlGaAs/GaAs heterojunction bipolar transistors using an emitter-thinning design.Appl Phys Lett,1985,47:839
  • 6[8]Summers G P,Burke E A,Shapiro P,et al.Damage correlation in semiconductors exposed to gamma,electron and proton radiatiom.IEEE Trans Nuci Sci,1993,40(6):1372
  • 7[9]Roldan J M,Niu G,Ansley W E,et al.Basic mechanisms of radiation effects-an investigation of the spatial location of proton-induced traps in SiGe HBTs.IEEE Trans Nucl Sci,1998,45(6):2424
  • 8[10]Zhang S M,Niu G F,Cressler J D,et al.A comparison of the effects of Gamma-irradiation on SiGe HBT and GaAs HBT technologies.IEEE Trans Nucl Sci,2000,47(6):2521

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部