全片层γ-TiAl基合金的塑性屈服分析

YIELDING ANALYSIS FOR FULL LAMINAR γ - TiAl ALLOYS

基于全片层 γ- Ti Al基合金的微结构 ,通过细观力学的方法和位错发射机理建立了临界屈服载荷与片层夹角的定量关系。同时还从连续细观力学的角度给出了横向同性片层复合材料计算基体Mises等效应力的一种解析方法 ,并用于分析全片层γ- Ti Al基合金材料的屈服。两种分析结果表明基于位错发射机理的方法与实验结果相吻合 ,这说明全片层γ- Ti Al基合金的屈服载荷与片层夹角的变化关系是由

Based on the microstructures of a full laminar γ TiAl alloy, a micromechanical model is proposed to evaluate the yield stress as a function of laminar's angle both from the dislocation emission mechanism and a continuum point of view A method is also proposed to calculate the average effective stress in a transverse isotropic matrix for a general composite The results show that the computation based on the dislocation emission mechanism agrees well with experiments This reveals that the dependence of the yield stress for the full laminar γ TiAl alloy on the laminar's angle owes itself to the detailed microstructure and the slip system of the material