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一种基于遗传算法的红外图像识别方法 被引量:1

A GENETIC ALGORITHM BASED METHOD FOR INFRARED IMAGE RECOGNITION
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摘要 本文提出了一种基于遗传算法的红外图像识别方法。首先对成像质量差的红外图像利用小波滤波器 (包括实和虚两部分 )有效地提取特征 ;然后运用遗传算法进行特征融合 ;最后是计算机仿真实验 。 A genetic algorithm based method for infrared image recognition is given. Gabor wavelet filters (including the real and imaginary parts) are used to extract features from the infrared image having poor quality. Genetic algorithm is then used to fuse the features. Computer simulation experiments are finally performed. Results of expriments show that the speed of convergence is fairly rapid and the recognition rate fairly high.
出处 《兵工学报》 EI CAS CSCD 北大核心 2000年第1期19-22,共4页 Acta Armamentarii
关键词 遗传算法 GABOR小波 红外图像 目标识别 A GENETIC ALGORITHM BASED METHOD FOR INFRARED genetic algorithm, Gabor wavelet, infrared image, target recognition
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参考文献4

  • 1[1]Gabor D. Theory of communication. Journal of Institute for Electrical Engineering, 1946,93:429~457
  • 2[2]Daugman J. Uncertainty relation for resolution in space, spatial frequency and orientation optimized by two-dimensional visual cortical filters. Journal of the Optical Society of America A, 1985,2:1160~1169
  • 3[3]Weber D. Fusion and optimized Gabor filter design for object detection. SPIE, 1995,2588:622~675
  • 4[4]Casasent D. Gabor wavelet filters and fusion for distortion-invariant multi-class object detection. SPIE, 1995,2491:430~440

同被引文献5

  • 1甘树坤,欧宗瑛,魏鸿磊.基于灰度特性的指纹图像分割算法[J].吉林化工学院学报,2006,23(1):68-71. 被引量:19
  • 2Rafael Navarro,Antonio Tabernero.Gaussian wavelet transform: Two alternative fast implementations for images[J]. Multidimensional Systems and Signal Processing . 1991 (4)
  • 3Eumar Ajay,Pang Grantham.Defect detection in tex-tured materials using Gabor filters. IEEE Transac-tions on Industry Application . 2002
  • 4Clausi,D.A.,Jernigan,M.E.Designing Gabor filters for optimal texture separability. Pattern Recognition . 2000
  • 5Ding lihong,Xiao le,Zhu yuwen,Liu wanchun,Liu yang.Gabor filter based automatic textile defect detection. Proceedings of SPIE the International Society for Optical Engineering . 2002

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