摘要
A mathematical model for describing the relationship betweenelectrical conductivity and the thickness of bilayer, ratio of sublayer thickness of a nano-scale multilayer material (MLM) is presented. Fe/Cu MLM was synthesized by electron beam physical vapor deposition (EB-PVD) technique, and the dependence of electrical conductivity of Fe/Cu MLM on the bilayer thickness and ratio of sublayer thickness were investigated. It is shown that the electrical conductivity of Fe/Cu MLM with fixed ratio of sublayer thickness decreases sharply when the thickness of bilayer becomes thinner than 30 nm. When the bilayer thickness is kept constant, the electrical conductivity linearly decreases with the increasing ratio of sublayer thickness. The values of parameters in the model were obtained by fitting the measured results of electrical conductivity of Fe/Cu MLM with fixed ratio of sublayer thickness. It is found that the calculated values agree well with measured ones.
基金
This work was supported by the National Natural Science Foundation of China (Grant No. 59425001).
