摘要
Environmental stress screening (ESS) is a technological process to reduce the costly early field failure of electronic components. This paper builds an optimization model for ESS of electronic components to obtain the optimal ESS duration. The failure phenomena of ESS are modeled by mixed distribution, and optimal ESS duration is defined by maximizing life-cycle cost savings under the condition of meeting reliability requirement.
Environmental stress screening (ESS) is a technological process to reduce the costly early field failure of electronic components. This paper builds an optimization model for ESS of electronic components to obtain the optimal ESS duration. The failure phenomena of ESS are modeled by mixed distribution, and optimal ESS duration is defined by maximizing life-cycle cost savings under the condition of meeting reliability requirement.
