摘要
文章研究防静电Kapton二次表面镜(ITO/Kapton/Al)在不同能量电子辐照后,太阳吸收比退化情况,并利用X射线光电子能谱仪(XPS)和扫描电子显微镜(SEM)对样品表面的成分和形貌进行了分析。结果表明,相同电子注量下,电子能量越高,对样品的太阳吸收率退化作用越大;电子辐照对样品表面形貌影响不大,但是会降低表面氧化铟锡的含量;不同能量的电子对样品表面成分的损伤效应是一致的。
The solar absorptance (αs) degradation of ITO/Kapton/Al films under irradiation of different energy electrons is studied. The X-ray photoelectron spectroscopy (XPS) and the scanning electronic microscope (SEM) are used to analyze the element contents and the morphologies of the samples. It is shown that the solar absorptances of the samples are degraded more severely by higher energy electron irradiation with the same irradiation flux. The morphologies of the samples are all changed little after various energy electron irradiations. The irradiation effects on the atomic contents of the samples are also discussed.
出处
《航天器环境工程》
2009年第5期411-414,397,共4页
Spacecraft Environment Engineering
基金
国家863计划资助项目(编号:2006AA04Z414)
