摘要
为准确评估闪烁薄膜探测器(OSFD)在脉冲裂变中子参数测量中γ射线对测量结果的影响,利用Geant4程序对闪烁薄膜探测器的X(或γ)射线响应进行模拟,结合半经验电子发光效率曲线,获得探测器能量响应理论曲线,利用662keV和1.25MeV的单能γ射线源,以及窄谱剂量标准的48～208keV准单能X射线能点对探测器响应进行刻度。本研究结果为闪烁薄膜探测器结构的改进,以及探测器在宽能谱脉冲X射线场测量中的应用提供了重要依据。
To obtain the impact of γ rays for the organic scintillation film detector(OSFD) in the field of pulsed fission neutron detection,the response of the OSFD to X or γ rays was studied with the Geant4 program.Combining with a semi-empirical scintillation efficiency function,the energy response function of the OSFD to γ rays was obtained.To verify the simulation result,the sensitivities of an OSFD employing 0.3 mm film to some discrete energy points were tested experimentally with 137Cs(662 keV) and 60Co(1.25 MeV) γ ray sources,as well as some discrete semi-monoenergetic X ray points(48 to 208 keV) of a standard narrow band X ray device.The research is instructive for the improvement of the detector structure,and the results are valuable for the application of the detector in measuring pulsed X rays with wide energy distribution.
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
2012年第11期1377-1381,共5页
Atomic Energy Science and Technology
