期刊文献+

锇在醋酸体系抛光液中化学机械抛光研究

Investigation on chemical mechanical polishing of osmium with CH_3COOH-based slurry
下载PDF
导出
摘要 锇有可能作为大规模集成电路铜互连扩散阻挡层新材料。本研究利用自制的醋酸体系抛光液对金属锇片进行抛光,研究了双氧水(H2O2)、醋酸(CH3COOH)和苯丙三氮唑(BTA)对腐蚀效果的影响。结果表明,CH3COOH能够在抛光液中起到酸剂、络合剂和抑制剂的作用;在CH3COOH体系抛光液中,H2O2主要通过促进阴极反应的进行从而增强抛光液对金属锇的化学作用,H2O2浓度的增加虽然提高了对金属锇化学腐蚀的能力,但不利于金属表面钝化膜的形成;BTA的加入促进金属锇表面钝化膜的生成,因此降低了腐蚀电流,且金属锇表面钝化膜的厚度随BTA浓度的增加而增加。 Osmium(Os) may be used as new barrier material in copper interconnects of ultra-large scale integration.In this work,Os disk was polished with self-made CH3COOH-based slurry,the effect of H2O2,CH3COOH and BTA on the corrosion behaviours was investigated.It was found that,CH3COOH played a role of pH adjusting agent,complexing agent and inhibitor in the slurry;In CH3COOH-based slurry,H2O2 could enhance the chemical action of the slurry on the surface of Os through accelerating the cathode reaction;The increasing of H2O2 concentration promoted the chemical corrosion ability to the surface of Os,but inhibited the formation of passive film;The addition of BTA decreased the value of Icorr,possibly due to the presence of the passive film;The thickness of the passive film increased with the increase of BTA concentration.
出处 《金刚石与磨料磨具工程》 CAS 2012年第4期31-36,共6页 Diamond & Abrasives Engineering
基金 国家自然科学基金项目(50975002) 教育部高校留学回国人员科研项目 安徽工业大学创新团队项目(TD201204)
关键词 化学机械抛光 醋酸 极化曲线 阻挡层材料 chemical mechanical polishing osmium acetic acid polarization curve barrier layer material
  • 相关文献

参考文献14

  • 1宋晓岚,李宇焜,江楠,屈一新,邱冠周.化学机械抛光技术研究进展[J].化工进展,2008,27(1):26-31. 被引量:48
  • 2王胜利,刘玉岭.ULSI制备中铜布线化学机械抛光技术的研究与展望[J].河北工业大学学报,2006,35(5):17-22. 被引量:2
  • 3陈杨,陈志刚,李霞章,陈爱莲.硅晶片化学机械抛光材料去除机制与模型[J].润滑与密封,2006,31(4):119-122. 被引量:4
  • 4何捍卫,胡岳华,黄可龙.铜在硝酸介质苯并三唑抛光液中化学-机械抛光时的电化学行为[J].过程工程学报,2002,2(1):67-70. 被引量:4
  • 5S Seal,SC Kuiry,B Heinmen.Effect of glycine and hydrogen peroxide on chemical–mechanical planarization of copper[].Thin Solid films.2003
  • 6D. Josell,J. E. Bonevich,T. P. Moffat,T. Aaltonen,M. Ritala,M. Leskela.Iridium Barriers for Direct Copper Electrodeposition in Damascene Processing[].Electrochemical and Solid State Letters.2006
  • 7Esta Abelev,Andrew Jonathan Smith,Achim Walter Hasse,Yair Ein-Eli.Potassium sorbate solutions as copper chemical mechanical planarization (CMP) based slurries[].Electrochimica Acta.2007
  • 8Lee Woo-Jin,Park Hyung-Soon.Development of novelprocess for Ru CMP using ceric ammonium nitrate (CAN)-containing nitric acid[].Applied Surface Science.2004
  • 9Kim N H,Lim J H,Kim S Y,et al.Effects of phosphoric acid stabilizer on copper and tantalum nitride CMP[].Materials Letters.2003
  • 10Moffat T P,Walker M,Chen P J,et al.Electrodeposition of Cuon Ru Barrier Layers for Damascene Processing[].Journal ofthe Electrochemical Society.2006

二级参考文献101

共引文献54

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部