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Improved GaN grown on Si(111) substrate using ammonia flow modulation on SiN_x mask layer by MOCVD 被引量:1

Improved GaN grown on Si(111) substrate using ammonia flow modulation on SiN_x mask layer by MOCVD
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摘要 In this paper,1 μm n-GaN was grown by using varied and fixed ammonia flow (NH3) on SiNx mask layer on Si(111) substrate using metal organic chemical vapor deposition (MOCVD). In-situ optical reflectivity traces of GaN growth show that the three-to two-dimensional process has been prolonged by using varied ammonia flow on SiNx mask layer method compared with that grown by fixing ammonia flow. Structural and optical properties were characterized by high-resolution X-ray diffraction and photolu-minescence,and compared with the sample grown by fixing ammonia flow,GaN grown using the varied ammonia flow on SiNx mask layer showed better structure and optical quality. It was assumed that the low NH3 flow in the initial growth stage considerably increased the GaN island density on the nano-porous SiNx layer by enhancing vertical growth. Lateral growth was significantly favored by high NH3 flow in the subsequent step. As a result,the improved crystal and optical quality was achieved utilizing NH3 flow modulation for GaN buffer growth on Si(111) substrate. In this paper, 1 μm n-GaN was grown by using varied and fixed ammonia flow (NH3) on SiN x mask layer on Si(111) substrate using metal organic chemical vapor deposition (MOCVD). In-situ optical reflectivity traces of GaN growth show that the three- to two-dimensional process has been prolonged by using varied ammonia flow on SiN x mask layer method compared with that grown by fixing ammonia flow. Structural and optical properties were characterized by high-resolution X-ray diffraction and photoluminescence, and compared with the sample grown by fixing ammonia flow, GaN grown using the varied ammonia flow on SiNx mask layer showed better structure and optical quality. It was assumed that the low NH3 flow in the initial growth stage considerably increased the GaN island density on the nano-porous SiN x layer by enhancing vertical growth. Lateral growth was significantly favored by high NH3 flow in the subsequent step. As a result, the improved crystal and optical quality was achieved utilizing NH3 flow modulation for GaN buffer growth on Si(111) substrate.
出处 《Science China(Technological Sciences)》 SCIE EI CAS 2009年第9期2758-2761,共4页 中国科学(技术科学英文版)
关键词 GaN EPILAYER MOCVD NH3 modulation GaN epilayer MOCVD NH3 modulation
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  • 1XIE ZiLi1, ZHANG Rong1, JIANG RuoLian1, LIU Bin1, GONG HaiMei2, XIU XiangQian1, CHEN Peng1, LU Hai1, HAN Ping1, SHI Yi1 & ZHENG YouDou1 1 Jiangsu Provincial Key Laboratory of Advanced Photonic and Electronic Materials, Physical Department of Nanjing University, Nanjing 210093, China,2 Shanghai Institute of Technical Physics, Chinese Academy of Science, Shanghai 200083, China.Structural and optical characteristics of Al_xGa_(1-x)N/AlN superlattice[J].Science China(Technological Sciences),2009,52(2):332-335. 被引量:2
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