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σ-LET curve obtained with heavy ions accelerated by HIRFL 被引量:2

σ-LET curve obtained with heavy ions accelerated by HIRFL
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摘要 σ-LET curve is one of the important factors for orbital SEU rate prediction. SEU cross sections of static random access memory (SRAM) IDT71256 were obtained with 35 MeV/u 36Ar ions and 15.14 MeV/u 136Xe ions, accelerated by Heavy Ion Research Facility in Lanzhou (HIRFL), fitted with Weibull and Lognormal function to obtain the whole σ-LET curve. The SEU rates of IDT71256 in geosynchronous and two sunsynchronous orbits were predicted with fitting parameters. σ-LET curve is one of the important factors for orbital SEU rate prediction. SEU cross sections of static random access memory (SRAM) IDT71256 were obtained with 35 MeV/u 36Ar ions and 15.14 MeV/u 136Xe ions, accelerated by Heavy Ion Research Facility in Lanzhou (HIRFL), fitted with Weibull and Lognormal function to obtain the whole σ-LET curve. The SEU rates of IDT71256 in geosynchronous and two sunsynchronous orbits were predicted with fitting parameters.
出处 《Chinese Science Bulletin》 SCIE EI CAS 2002年第17期1431-1433,共3页
基金 This work was supported by the National Natural Science Foundation of China (Grant Nos. 19775058 and 10075064) the Chinese Academy of Sciences.
关键词 static random access memory single event upset σ-LET CURVE Weibull DISTRIBUTION LOGNORMAL distribution. static random access memory single event upset σ-LET curve Weibull distribution Lognormal distribution
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