摘要
We calculate and analyze the scattering near the field from some simple and complex targets using the method of picture elements (PEL), based upon the method of high-frequency approximation. It introduces the critical distance of the near field and the far field which is related with the dimension of the target. The problem of the EMS near field from large size objects can be transformed to the problem of the far field by parting it to many very small size elements. By calculating the EMS near fields of some simple and complex targets based on the SCTE (scattering from complex targets and environments) system, the results show that there are much difference between the near field and the far field. And the characteristics of the near field are more complicated. This work has practical engineering value in the area of the electromagnetic compatibility (EMC), electromagnetic interference (EMI) prediction and electromagnetic scattering (EMS).
We calculate and analyze the scattering near the field from some simple and complex targets using the method of picture elements (PEL), based upon the method of high-frequency approximation. It introduces the critical distance of the near field and the far field which is related with the dimension of the target. The problem of the EMS near field from large size objects can be transformed to the problem of the far field by parting it to many very small size elements. By calculating the EMS near fields of some simple and complex targets based on the SCTE (scattering from complex targets and environments) system, the results show that there are much difference between the near field and the far field. And the characteristics of the near field are more complicated. This work has practical engineering value in the area of the electromagnetic compatibility (EMC), electromagnetic interference (EMI) prediction and electromagnetic scattering (EMS).
