摘要
The methods for determining electron beam direction and misorientation angle/axis of grain boundaries are described in this paper. The present methods are based on a series of diffraction spot patterns obtained by systematic tilt of the crystal, combined with simple mathematical calculations. Instead of the use of Kikuchi patterns, the limitations resulting from the visibility or sharpness of Kikuchi lines and the number of Kikuchi pole(s) existed are avoided and a sufficient accuracy of determination has been achieved.
The methods for determining electron beam direction and misorientation angle/axis of grain boundaries are described in this paper. The present methods are based on a series of diffraction spot patterns obtained by systematic tilt of the crystal, combined with simple mathematical calculations. Instead of the use of Kikuchi patterns, the limitations resulting from the visibility or sharpness of Kikuchi lines and the number of Kikuchi pole(s) existed are avoided and a sufficient accuracy of determination has been achieved.
