摘要
用X射线衍射仪做定量分析衍射实验 ,会出现因盖革计数器存在分辨时间而漏计的现象 .为了简便地测定分辨时间 ,本文利用单层膜二次照射技术 ,导出了用来校正积分强度的近似公式 ,并与逐点校正法作了对比分析 。
In quantitative analysis of diffraction experiment by X ray diffraction meter,resolving time of Geiger counter would result in metrical omitting. In order to measure the resolving time, the method of double irradiation on monolayer film is given, and the approximate expression to correct integrated intensity is derived. The results are in perfect accordance with point to point emendation.
出处
《物理实验》
北大核心
2004年第6期8-9,共2页
Physics Experimentation
关键词
X射线
衍射
分辨时间
积分强度
X-ray
diffraction
resolving time
integrated intensity
