摘要
Spline wavelet transform is used to resolve overlapping voltammetric peaks. A suitable resolving factor is chosen to multiply the filters of spline wavelet and make it a peak resoluter. Simulated overlapping voltammetric peaks are processed by the peak resoluter and satisfactory results are obtained. Base-line separation can be achieved, the relative errors of peak position are less than 3.0%, and the relative errors of peak area are less than 5.0%. The effect of different resolving factors and spline wavelet basis are discussed. To test the procedure, two systems, cadmium (Ⅱ)-indium (Ⅲ) and lead (Ⅱ)-thallium (Ⅰ), are used.
Spline wavelet transform is used to resolve overlapping voltammetric peaks. A suitable resolving factor is chosen to multiply the filters of spline wavelet and make it a peak resoluter. Simulated overlapping voltammetric peaks are processed by the peak resoluter and satisfactory results are obtained. Base-line separation can be achieved, the relative errors of peak position are less than 3.0%, and the relative errors of peak area are less than 5.0%. The effect of different resolving factors and spline wavelet basis are discussed. To test the procedure, two systems, cadmium (II)-indium (III) and lead (II)-thallium (I), are used.