摘要
导出了STN产品低温下出现黑点的临界温度估算公式,讨论了影响临界温度的各种因素,估算了在特定条件下出现低温黑点的临界温度。
An estimation of the critical bubbling temperature in the low temperatureSTN-LCD is deduced. The effects of various factors on the critical temperature are dis-cussed. Some critical temperatures in special conditions are estimated.
出处
《光电子技术》
CAS
1997年第3期182-184,共3页
Optoelectronic Technology