摘要
The present research exploits diffusion brazing of mechanically alloyed Y 2O_3 dispersion strengthened nick-el-base MA760 and iron-base MA956 alloys using B-and P-containing thin foil and sputter coated interlayers.Microstructures of diffission brazed interface before and after recrystallization annealing were investigated usingoptical metallography, electron microprobe analysis, and transmission electron microscopy. It has been foundthat B and P have a strons influence on the recrystallization behavior of these materials. Too high B or P levelsin the interlayers caused recrystallization of the base alloys during brazing process which was operated at temperatures below normal recrystallization points.
The present research exploits diffusion brazing of mechanically alloyed Y 2O_3 dispersion strengthened nick-el-base MA760 and iron-base MA956 alloys using B-and P-containing thin foil and sputter coated interlayers.Microstructures of diffission brazed interface before and after recrystallization annealing were investigated usingoptical metallography, electron microprobe analysis, and transmission electron microscopy. It has been foundthat B and P have a strons influence on the recrystallization behavior of these materials. Too high B or P levelsin the interlayers caused recrystallization of the base alloys during brazing process which was operated at temperatures below normal recrystallization points.
