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STG-BASED VERIFICATION AND TEST GENERATION

STG-BASED VERIFICATION AND TEST GENERATION
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摘要 This paper presents the techniques of verification and Test Generation(TG) for sequential machines (Finite State Machines, FSMs) based on state traversing of State Transition Graph(STG). The problems of traversing, redundancy and transition fault model are identified. In order to achieve high fault coverage collapsing testing is proposed. Further, the heuristic knowledge for speeding up verification and TG are described. This paper presents the techniques of verification and Test Generation(TG) for sequential machines (Finite State Machines, FSMs) based on state traversing of State Transition Graph(STG). The problems of traversing, redundancy and transition fault model are identified. In order to achieve high fault coverage collapsing testing is proposed. Further, the heuristic knowledge for speeding up verification and TG are described.
出处 《Journal of Electronics(China)》 1996年第1期68-73,共6页 电子科学学刊(英文版)
基金 Supported by the National Natural science Foundation of China(No.69576038)
关键词 VERIFICATION TEST GENERATION Traversing STATE TRANSITION GRAPH Verification Test generation Traversing State transition graph
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