摘要
A kinetic model of dielectric ageing is presented. The central finding of this investigation is that there is a power-law relationship between the local electric field concentration and the rate of defect-tip initiated conducting crack growth. By applying such a power-law conducting crack growth rate expression to the evaluation of the life of solid dielectrics, the empirical classical ageing law of insulation materials can be derived theoretically as a lobical result. All the results are universal and agree with the experimental data of oxide films.
提出了介电老化的动力学模型．该研究的主要结论是，在传导缺陷顶端的局部电场集中因子与传导缺陷长大速率之间存在一个幂指数定律关系．将该幂指数定律表示的传导缺陷长大速率公式应用于计算介电固体的寿命，从理论上自然地推导出了绝缘材料的经典电老化定律．所有结果是普适的，并和超薄氧化膜的实验资料相吻合．
