摘要
PLA以其独特的优势和规整的结构越来越广泛地应用于复杂的VLSI系统的设计中,其测试问题由于它的难度和特殊性颇受普遍重视。十多年来,许多研究人员专注于PLA测试方法的研究,提出了不少解决的办法。本文试图在讨论PLA的故障类型及其故障模型和检测关系的基础上,归纳总结并分析现有PLA故障测试生成的几类主要方法。
The autematic design of typical methods of pLA fault test generaProgrammable Logic Array(pLA) has been tion, based on the discussion 'f the PLA rapidly develped since 1980's, which is a fault model and the relationship of detec-design technique used to design optimally tion between the PLA fault types. LSI digital system. This papen will briefly summarize and analyze the current f ur
出处
《计算机技术与发展》
1992年第2期1-8,共8页
Computer Technology and Development
