摘要
对利用差谱—二阶导数分光光度法直接测定强干扰基体中微量组分的原理和实验方法进行了探讨.以测定钴中的微量锰为例,考查了该法在5～50mg/mL钴存在下测定锰的线性范围和精密度,对测定钴中0.001%～0.05%的锰取得了满意的结果.
A new method for determining directly trace component in interfering base by absorbance subtraction -second derivative spectrophotometry is proposed. Trace amounts manganese in cobalt salts has been determined with this method. The calibration graphs of manganese are 0. 20 to 2. 5 μg/mL in 5 to 50 mg/ mL cobalt. The method is applied to the analysis of 0. 001 to 0. 05％ manganese in cobalt salts with satisfactory results.
出处
《辽宁师范大学学报（自然科学版）》
CAS
1992年第4期306-309,共4页
Journal of Liaoning Normal University:Natural Science Edition
关键词
差谱
二阶导数光度法
锰测定
absorbance subtraction
second derivative spectrophotometry
determination of manganese
